B3DVM-6000x 3D profiler with 6000x magnification and 100nm measurement resolution

1. 3D Profiler with ultra-depth precision measuring instrument

The system allows great measurement of roughness, height, depth and flatness. It has up to 6000x magnification, can do 3D modelling and measure the height at 100nm resolution.

2. 3D Imaging

• RGB point cloud image
• Top and bottom view observation with low and high zoom
• construct 3D graphics,
• drag and adjust any position at 720′
• generate a sectional view
• superimpose color information on the image
• use color distinction to bump details

3. Measurement Tools with 3D profiler

High precision real time measurement

Using 3D modelling, ultra depth of field image synthesis is suitable for depth measurement  of products with stepped surfaces, blind holes, grooves and irregular shapes

4. Image Capture Function

Real-time high quality images

positioning, focusing, magnification conversion and other functions can be performed all through the user friendly software by simply placing a sample on the stage.

5. 100nm resolution in Z depth / focus ultra depth of field synthesis, fine full frame.

after ultra depth of field (DOF) synthesis function is applied to a high magnification observation, the depth of field of different planes are superimposed to get a stereoscopic 3D observation of image.

The z-axis is driven by a high-precise electromotor, which can measure up to 100nm / 0.1um distance between the positions.