Low Price High Resolution USB3.0 CMOS Microscope Cameras
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B3DVM-6000x 3D profiler with 6000x magnification and 100nm measurement resolution
- 3D profiler with Long working distance and very price depth measurement
- Advanced software for roughness, height depth and flatness measurement
- Up to 6000x magnification, 1 to 70mm sample height/thickness measurement, with 100nm / 0.1um measurement resolution
- Incident LED illumination, with brightfield and darkfield imaging
- Excellent extended depth of focus/field
- auto readout of so many measurements such as contour difference
- excellent choice for semi-condocture industry, copper foil, wafer step, arc height, battery, SMT fields
Free worldwide shipping on all orders over $50
- 30 days easy returns
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Features
- 3D profiler with extended working distance and exceptional depth measurement capabilities
- Sophisticated software enabling precise measurements of roughness, height depth, and flatness
- Magnification capabilities of up to 6000x, accommodating sample height/thickness measurements ranging from 1mm to 70mm, with a remarkable measurement resolution of 100nm / 0.1μm
- Equipped with incident LED illumination, providing both brightfield and darkfield imaging
- Remarkable extended depth of field, ensuring excellent imaging quality
- Automated readout of numerous measurements, including contour differences
- An outstanding choice for applications in the semiconductor industry, covering areas such as copper foil, wafer steps, arc height, batteries, and SMT fields
B3DVM-6000x 3D profiler with 6000x magnification and 100nm measurement resolution
Sample images
Below are sample images form semi-condocture industry, copper foil, wafer step, arc height, battery, SMT fields:
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SKU: B3DVM-6000x
Categories: 3D Profiler, 3D Profile, BIOIMAGER, Featured, Laser, Metallurgical Microscopes, Microscopes, Upright
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