Atomic Force Microscope


Atomic-force microscope resolves down to 0.2 nanometer Up to 1000X the resolution of optical microscopes Multi-mode scanning probe

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AFM Features
1. All-in-one design, smart structure and shape.
2. Scan head and sample stage are designed together, strong anti-vibration performance .
3.Precision laser detection and probe alignment device make laser adjustment simple and easy.
4.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
5.High-accuracy and large range sample transfer device allow to scan any interesting area of sample;
6.Different types of scanner meets different customer’s requirements in accuracy and scan size;
7.optical observation system for tip check and sample positioning.
8.Use servomotor to adjust optical system focus and magnification;
9.Electronic system is designed as modular and easy for maintenance and development.
10. Integrated with many working modes control electronics for further development.

AFM Features

  • 1. All-in-one design, smart structure and shape.
  • 2. Scan head and sample stage are designed together, strong anti-vibration performance .
  • 3. Precision laser detection and probe alignment device make laser adjustment simple and easy.
  • 4. Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.
  • 5. High-accuracy and large range sample transfer device allow to scan any interesting area of sample;
  • 6. Different types of scanner meets different customer’s requirements in accuracy and scan size;
  • 7. optical observation system for tip check and sample positioning.
  • 8. Use servomotor to adjust optical system focus and magnification;
  • 9. Electronic system is designed as modular and easy for maintenance and development.
  • 10. Integrated with many working modes control electronics for further development.

The AFM-1000 is an atomic-force microscope, which uses a scanning probe for various modes of monochromatic imaging. The system can resolve to 0.2nm, which far surpasses the limitations of optical microscopes by approximately 1000X. The scanning process uses three-dimensional movement up to 20µm laterally, and 2µm vertically.

The probe can be used for both contact and tapping modes, depending on the nature of the sample. Contact mode provides a force-measurement of the sample surface, resulting in high resolutions, but biased by friction and adhesion. Tapping modes avoid friction and adhesion through intermittent-contact. Along with topography, the probe can measure magnetic and electrostatic forces.

SKU: AFM-4 Categories: ,
ItemTechnical data
Operation modesContact mode, Tapping mode
Sample sizeΦ≤80 mm;H≤20 mm
Max. scan rangeX/Y: 50 um, Z: 5 um
ResolutionX/Y: 0.2 nm, Z: 0.05nm
Scan rate0.6 Hz~4.34 Hz
Scanning controlXY: 18-bit D/A, Z: 16-bit D/A
Data samplingOne 14-bit A/D and double 16-bit A/D multiple-channel simultaneously
Weight/Size40KG,700*480*450mm
Scan angle0~360 °
Sample movement0~20 mm
Pulse width of approaching motor10±2 ms
Magnification of CCDOptical magnification: 0.6~5X, Electronic magnification: 40X
Data points256×256,512×512
Feedback typeDSP digital feedback
Feedback sampling rate64.0KHz
PC connectionUSB2.0
WindowsCompatible with Windows98/2000/XP/7/8

User-friendly software and functions

1. Multi-channels images are capture and display synchronous, observe profile map in real time.

2. Obtain and measure many curves such as F-Z, f-RMS, RMS-Z

3. Execute scan area move and cut function, choose any interesting area of sample.

4. Scan sample in random angle at beginning.

5. Adjust the laser spot detection system in real time.

6. Search the resonance frequency of tip manually or automatically.

7. Choose and set different color of scanning image in palette.

8. Support linear average and offset calibration in real time for sample title.

9. Support scanner sensitivity calibration and electronic controller auto-calibration.

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