DIC Nomarski Video Inspection Microscope, BVM-DIC Series
Explore the advanced BVM-DIC Microscopy System for high-resolution imaging, enhanced contrast, and precise material analysis. Upgrade your research capabilities today.
The BVM-DIC Series Differential Interference Contrast Microscopy System is an essential tool for advanced research. Utilizing dual-beam polarization interference, it delivers high-resolution imaging with enhanced contrast, ideal for detecting conductive particles, surface cracks, and microbial cells. The system’s adjustable Nomarski prism allows for optimal brightness and interference color adjustments, providing superior observation.
Key features of the BVM-DIC include magnification options up to 50X, multiple objective lenses, and versatile lighting choices, such as 10W white or blue LEDs. This system excels in precise material analysis, ensuring accurate detection of fine structures, defects, and living cell activity.
Whether for conductive particle detection in LCD/OLED circuits or observing microbial cell activity, the BVM-DIC Series offers unparalleled detail and clarity. Its high-resolution capabilities clearly display intracellular contours and structures, making it perfect for various research applications. Upgrade your microscopy research with the BVM-DIC Series and experience the pinnacle of imaging performance.
Application
1. Conductive Particle Detection in LCD/OLED and Other Products
Detecting conductive particles in LCD circuits is crucial for ensuring optimal conductive performance. An insufficient number of conductive particles can degrade the circuit’s conductivity, potentially leading to display failures. Conversely, an excess can result in raw material wastage. Additionally, adhered conductive particles can skew particle counts, leading to underestimation and inaccurate detection results.
As illustrated in Figure 1, conductive particles are not visible using a metallographic microscope with reflected light brightfield imaging. In contrast, Figure 2 demonstrates the clear outline of these particles when using a DIC microscope system. Figure 2 depicts conductive particles on an LCD screen captured with a DIC microscope, while Figure 1 shows the same area imaged with a metallographic microscope.
This highlights the superior capability of DIC microscopy in accurately detecting and analyzing conductive particles, making it an indispensable tool for researchers and professionals in the field.
2. Sample Surface Crack and Defect Detection
Differential Interference Contrast (DIC) microscopy stands out as a powerful tool in modern material metallographic examination, offering several advantages. It requires relatively low sample preparation and provides a pronounced relief effect in observed images.
Figure 3 illustrates this capability: the left side shows fine structures or defects that are invisible or barely visible under an ordinary metallographic microscope with incident light, while the right side reveals these details clearly using the MVM-DIC Series Differential Interference Contrast microscope system. Additionally, the MVM-DIC series system excels at revealing particles, holes, cracks, and uneven contours in the sample, ensuring more reliable material analysis.
This makes the MVM-DIC Series an indispensable instrument for researchers and professionals focused on detailed and accurate detection of surface cracks and defects.
 Figure 3A. Brightfield |
 Figure 3B. DIC Nomarski |
3. Microbial Cell Detection
The BVM-DIC Series Differential Interference Contrast microscope system enables non-destructive detection of living cell activity. Utilizing optical staining effects, it allows for the adjustment of images with different interference colors and the ability to change the focal length to obtain clear images at various depths. With high resolution, this system can distinctly display intracellular contours and structures. Figures 4 and 5 demonstrate the comparative results, highlighting the effectiveness of the BVM-DIC system in microbial cell detection.
This advanced system is ideal for researchers and academics focused on precise and detailed observations of living microbial cells.
|
|
 Figure 4A. Earthworm, Brightfield, 50x |
 Figure 4B. Earthworm, DIC, 50x |
 Figure 5A. Cucurbit Stem, brightfield |
 Figure 5B. Cucurbit Stem, DIC |
Only logged in customers who have purchased this product may leave a review.
Specifications